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Data Mining Tutorial

July 16, 2023, New York / USA

Prof. Dr. Petra Perner

With Data Mining techniques, it is possible to "mine" data pools for "hidden" knowledge. Data mining gives you a major competitive advantage in view of the key role played by knowledge and knowledge management in the development of future markets. So why not join us on the route from simple data archiving to automatic knowledge extraction!

Participants will receive a stampend and signed certificate by IBaI for their participation in the tutorial and the tutorial material.

For further information about the tutorial please visit:


Report Data Mining Tutorial 2013 in New York

The tutorial is advised to young researchers but also to active and experienced researchers.

The tutorial cover the state-of-the-art research and some specific data mining applications. It can be very useful to stimulate and facilitate future work. It provides the exchange and dissemination of innovative, practical development experiences by promoting novel, high quality research findings, and innovative solutions to challenging data mining problems.

Participation to Data Mining Tutorial day it is very useful!

Sabina Tangaro,
Istituto Nazionale di Fisica Nucleare, Sezione di Bari, Italy

Report Data Mining Tutorial 2011 in New York

The tutorial days have been an excellent getting started for the Industrial Conference on Data Mining 2011 in New York.

In an extremely pleasant atmospere and within a manageable group we get an insight in the possibilities of modern data handling by using data mining. Thereby, the speaker Prof. Petra Perner has been successful in explaining and illustrating the basics understandably with well-chosen examples. Furthermore she could interpose the underlying mathematics.

It has become clear for me, in which big field data mining is already used and can be used for future topics. Based on this tutorials I could get a big amount of new ideas and, afterwards, I could discuss it with the participants as well as speakers, too.

Very exciting! Thank you very much!

I am already looking forward to next year's meeting.

Thomas Spittler,
Technical University of Munich, Germany

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